TY  - JOUR
AU  - Shah, Afzal
AU  - Naz, Shakeela
AU  - Faisal, Shah
AU  - Iqbal, Qaisar
AU  - Abdullah, Sher
AU  - Manan, Abdul
PY  - 2026
DA  - 2026/06/29
TI  - Phase, Microstructure and Dielectric Properties of Sodium Bismuth Titanate Based Ceramics
JO  - Journal of Advanced Electronic Materials
T2  - Journal of Advanced Electronic Materials
JF  - Journal of Advanced Electronic Materials
VL  - 2
IS  - 2
SP  - 64
EP  - 68
DO  - 10.62762/JAEM.2026.298040
UR  - https://www.icck.org/article/abs/JAEM.2026.298040
KW  - solid-state reactions
KW  - relaxor behavior
KW  - dielectric characteristics
AB  - In this study, ceramics in the 0.90Na$_{0.5}$Bi$_{0.5-x}$La$_{x}$TiO$_{3}$--0.03NaNbO$_{3}$ --0.07 Ba(Zr$_{0.2}$ Ti$_{0.8}$)O$_{3}$ series (where $x = 0.00, 0.03,$ $ 0.05, 0.07$) were processed via a solid-state reaction method. The phase, microstructural features, and dielectric properties, particularly the dielectric constant and dielectric loss, were studied using X-ray diffraction (XRD), scanning electron microscopy (SEM), and dielectric spectroscopic techniques, respectively. XRD analysis revealed a single perovskite phase, while SEM analysis showed a dense microstructure with reduced grain size as the $x$ content increased. The increase in doping content enhanced the relaxor characteristics, which consequently reduced the dielectric loss to below 0.05 for $x = 0.07$.
SN  - 3070-5649
PB  - Institute of Central Computation and Knowledge
LA  - English
ER  - 

@article{Shah2026Phase,
  author = {Afzal Shah and Shakeela Naz and Shah Faisal and Qaisar Iqbal and Sher Abdullah and Abdul Manan},
  title = {Phase, Microstructure and Dielectric Properties of Sodium Bismuth Titanate Based Ceramics},
  journal = {Journal of Advanced Electronic Materials},
  year = {2026},
  volume = {2},
  number = {2},
  pages = {64-68},
  doi = {10.62762/JAEM.2026.298040},
  url = {https://www.icck.org/article/abs/JAEM.2026.298040},
  abstract = {In this study, ceramics in the 0.90Na\$\_{0.5}\$Bi\$\_{0.5-x}\$La\$\_{x}\$TiO\$\_{3}\$--0.03NaNbO\$\_{3}\$ --0.07 Ba(Zr\$\_{0.2}\$ Ti\$\_{0.8}\$)O\$\_{3}\$ series (where \$x = 0.00, 0.03,\$ \$ 0.05, 0.07\$) were processed via a solid-state reaction method. The phase, microstructural features, and dielectric properties, particularly the dielectric constant and dielectric loss, were studied using X-ray diffraction (XRD), scanning electron microscopy (SEM), and dielectric spectroscopic techniques, respectively. XRD analysis revealed a single perovskite phase, while SEM analysis showed a dense microstructure with reduced grain size as the \$x\$ content increased. The increase in doping content enhanced the relaxor characteristics, which consequently reduced the dielectric loss to below 0.05 for \$x = 0.07\$.},
  keywords = {solid-state reactions, relaxor behavior, dielectric characteristics},
  issn = {3070-5649},
  publisher = {Institute of Central Computation and Knowledge}
}