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Volume 1, Issue 1, Journal of Advanced Electronic Materials
Volume 1, Issue 1, 2025
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Journal of Advanced Electronic Materials, Volume 1, Issue 1, 2025: 39-46

Open Access | Research Article | 13 December 2025
Effect of Ta Doping on the Structural, Microstructural, and Electrical Properties of NaNbO3 for Energy Storage Applications
1 School of Computing, Engineering and Built Environment, Edinburgh Napier University, Edinburgh EH10 5DT, United Kingdom
2 School of Chemical and Process Engineering, University of Leeds, Leeds LS2 9JT, United Kingdom
* Corresponding Author: Sairatun Nesa Soheli, [email protected]
Received: 10 September 2025, Accepted: 05 November 2025, Published: 13 December 2025  
Abstract
Enhancing the energy-storage performance of lead-free dielectric ceramics is essential for developing environmentally sustainable capacitors and power devices. NaNbO$_3$, a promising perovskite, exhibits considerable potential for dielectric applications but is limited by poor densification and high dielectric loss. In this work, the effects of tantalum (Ta) doping at varying concentrations $\text{NaNb}_{1-x}\text{Ta}_x\text{O}_3$, with $x = 0.05, 0.10, \text{and } 0.15$, corresponding to 5%, 10%, and 15% Ta substitution on the crystal structure, microstructure, and electrical properties of NaNbO$_3$ ceramics were systematically investigated. X-ray diffraction (XRD) confirmed phase purity and the orthorhombic perovskite structure, while scanning electron microscopy (SEM) revealed enhanced grain uniformity and densification with increasing Ta content. Electrical characterisation was conducted using complex impedance spectroscopy, dielectric loss ($\tan \delta$), capacitance ($C'$), and admittance ($Y'$) measurements over a frequency range of $10^1$ to $10^6$ Hz. The results indicate that 15% Ta-doped NaNbO$_3$ exhibits the optimal combination of a high dielectric constant and low dielectric loss. This improvement is attributed to refined grain morphology and optimised Ta substitution, confirming its potential as a high-performance, lead-free dielectric material for advanced energy-storage devices.

Graphical Abstract
Effect of Ta Doping on the Structural, Microstructural, and Electrical Properties of NaNbO3 for Energy Storage Applications

Keywords
NaNbO3
antiferroelectric
lead-free materials
perovskite ceramics
energy storage capacitors

Data Availability Statement
Data will be made available on request.

Funding
This work was supported without any funding.

Conflicts of Interest
The authors declare no conflicts of interest.

Ethical Approval and Consent to Participate
Not applicable.

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Cite This Article
APA Style
Soheli, S. N., Wilson, C., Sun, D., Shyha, I., & Lu, Z. (2025). Effect of Ta Doping on the Structural, Microstructural, and Electrical Properties of NaNbO3 for Energy Storage Applications. Journal of Advanced Electronic Materials, 1(1), 39–46. https://doi.org/10.62762/JAEM.2025.415620
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TY  - JOUR
AU  - Soheli, Sairatun Nesa
AU  - Wilson, Callum
AU  - Sun, Dongyang
AU  - Shyha, Islam
AU  - Lu, Zhilun
PY  - 2025
DA  - 2025/12/13
TI  - Effect of Ta Doping on the Structural, Microstructural, and Electrical Properties of NaNbO3 for Energy Storage Applications
JO  - Journal of Advanced Electronic Materials
T2  - Journal of Advanced Electronic Materials
JF  - Journal of Advanced Electronic Materials
VL  - 1
IS  - 1
SP  - 39
EP  - 46
DO  - 10.62762/JAEM.2025.415620
UR  - https://www.icck.org/article/abs/JAEM.2025.415620
KW  - NaNbO3
KW  - antiferroelectric
KW  - lead-free materials
KW  - perovskite ceramics
KW  - energy storage capacitors
AB  - Enhancing the energy-storage performance of lead-free dielectric ceramics is essential for developing environmentally sustainable capacitors and power devices. NaNbO$_3$, a promising perovskite, exhibits considerable potential for dielectric applications but is limited by poor densification and high dielectric loss. In this work, the effects of tantalum (Ta) doping at varying concentrations $\text{NaNb}_{1-x}\text{Ta}_x\text{O}_3$, with $x = 0.05, 0.10, \text{and } 0.15$, corresponding to 5%, 10%, and 15% Ta substitution on the crystal structure, microstructure, and electrical properties of NaNbO$_3$ ceramics were systematically investigated. X-ray diffraction (XRD) confirmed phase purity and the orthorhombic perovskite structure, while scanning electron microscopy (SEM) revealed enhanced grain uniformity and densification with increasing Ta content. Electrical characterisation was conducted using complex impedance spectroscopy, dielectric loss ($\tan \delta$), capacitance ($C'$), and admittance ($Y'$) measurements over a frequency range of $10^1$ to $10^6$ Hz. The results indicate that 15% Ta-doped NaNbO$_3$ exhibits the optimal combination of a high dielectric constant and low dielectric loss. This improvement is attributed to refined grain morphology and optimised Ta substitution, confirming its potential as a high-performance, lead-free dielectric material for advanced energy-storage devices.
SN  - pending
PB  - Institute of Central Computation and Knowledge
LA  - English
ER  - 
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@article{Soheli2025Effect,
  author = {Sairatun Nesa Soheli and Callum Wilson and Dongyang Sun and Islam Shyha and Zhilun Lu},
  title = {Effect of Ta Doping on the Structural, Microstructural, and Electrical Properties of NaNbO3 for Energy Storage Applications},
  journal = {Journal of Advanced Electronic Materials},
  year = {2025},
  volume = {1},
  number = {1},
  pages = {39-46},
  doi = {10.62762/JAEM.2025.415620},
  url = {https://www.icck.org/article/abs/JAEM.2025.415620},
  abstract = {Enhancing the energy-storage performance of lead-free dielectric ceramics is essential for developing environmentally sustainable capacitors and power devices. NaNbO\$\_3\$, a promising perovskite, exhibits considerable potential for dielectric applications but is limited by poor densification and high dielectric loss. In this work, the effects of tantalum (Ta) doping at varying concentrations \$\text{NaNb}\_{1-x}\text{Ta}\_x\text{O}\_3\$, with \$x = 0.05, 0.10, \text{and } 0.15\$, corresponding to 5\%, 10\%, and 15\% Ta substitution on the crystal structure, microstructure, and electrical properties of NaNbO\$\_3\$ ceramics were systematically investigated. X-ray diffraction (XRD) confirmed phase purity and the orthorhombic perovskite structure, while scanning electron microscopy (SEM) revealed enhanced grain uniformity and densification with increasing Ta content. Electrical characterisation was conducted using complex impedance spectroscopy, dielectric loss (\$\tan \delta\$), capacitance (\$C'\$), and admittance (\$Y'\$) measurements over a frequency range of \$10^1\$ to \$10^6\$ Hz. The results indicate that 15\% Ta-doped NaNbO\$\_3\$ exhibits the optimal combination of a high dielectric constant and low dielectric loss. This improvement is attributed to refined grain morphology and optimised Ta substitution, confirming its potential as a high-performance, lead-free dielectric material for advanced energy-storage devices.},
  keywords = {NaNbO3, antiferroelectric, lead-free materials, perovskite ceramics, energy storage capacitors},
  issn = {pending},
  publisher = {Institute of Central Computation and Knowledge}
}

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